UV-Vis/NIR spectrophotometers, UH4150

Dodávateľ: Hitachi
634-0952EA 0 EUR
634-0952 634-0951
UV-Vis/NIR spectrophotometers, UH4150
Spektrofotometry a spektrometry Spektrofotometry UV/Vis
These UV-Vis/NIR spectrophotometers offer enormous flexibility for the evaluation and quality control of solid samples, typically optical components or coated surfaces. They can be configured for non destructive measurements when equipped with relevant accessories for applications such as:

  • Micro sample reflectance measurement
  • Wafer reflectance/transmission measurement
  • Optical thin film reflection measurement
  • Lens transmittance measurement
  • Solar cells and coated glass evaluation

High precision accessories can measure at a range of incident angles.

For coated glass surfaces, the variable angle absolute reflectance accessory (20 to 60°) measures the absolute reflectance and transmittance at a desired angle by rotating the detector and the sample stage independently.

Objednávacie informácie: For more information on the range of accessories, please contact your local VWR agency.
Order Now

Learn more

About VWR

Avantor is a vertically integrated, global supplier of discovery-to-delivery solutions for...

Viac About VWR